Mehmet Aslan

A rail-to-rail buffer receiving a differential input signal and generating a differential output signal includes first and second amplifier circuits configured in a pseudo differential buffer structure and first and second comparators coupled to compare the respective part of the differential input signal and a first voltage and to generate select signals. Each of the first and second amplifier circuits includes first and second complementary differential input stages and the first and second… Show more

A rail-to-rail buffer receiving a differential input signal and generating a differential output signal includes first and second amplifier circuits configured in a pseudo differential buffer structure and first and second comparators coupled to compare the respective part of the differential input signal and a first voltage and to generate select signals. Each of the first and second amplifier circuits includes first and second complementary differential input stages and the first and second comparators generate respective select signals to turn on only one of the first or the second differential input stage in each amplifier circuit depending on a value of the respective part of the differential input signal. In operation, the first and second complementary differential input stages of each amplifier circuit not being turned on at the same time. Show less

An apparatus and method for canceling variations in the beta for a bipolar junction transistor so that the diode equation can be employed to accurately measure the temperature of the transistor based at least in part on a ratio of two target collector currents and two measurements of the base-emitter voltage of the transistor. If the determined collector current of the transistor is relatively equivalent to one of the first and second target collector currents, the transistor's base-emitter… Show more

An apparatus and method for canceling variations in the beta for a bipolar junction transistor so that the diode equation can be employed to accurately measure the temperature of the transistor based at least in part on a ratio of two target collector currents and two measurements of the base-emitter voltage of the transistor. If the determined collector current of the transistor is relatively equivalent to one of the first and second target collector currents, the transistor's base-emitter voltage is measured and stored. An analog feedback circuit can be employed to change the determined collector current to be relatively equivalent to the first and second target collector currents. The analog feedback circuit can include an optional sample and hold component to further reduce power consumption and reduce noise. A digital circuit can be employed to change the determined collector current to be relatively equivalent to the first and second target collector currents. Additionally, the transistor can be remotely located in another integrated circuit.
Show less

Calibrating a white level in an image scanning device. A target white level is accessed. A high white level is determined for pixel data output by an amplifier. A gain adjustment to the amplifier is determined to correct a portion of an error between the target white level and the high white level. The gain adjustment is applied to the amplifier.

A three-terminal, dual-diode system is compatible with both fully differential remote and single-ended remote temperature measurement systems. Fully differential remote temperature sensor systems offer better noise immunity and can perform faster conversions with less sensitivity to series resistance than single-ended systems. The two diode system can be used with either fully differential or single-ended temperature measurement systems, which can be used when upgrading from a single-ended… Show more

A three-terminal, dual-diode system is compatible with both fully differential remote and single-ended remote temperature measurement systems. Fully differential remote temperature sensor systems offer better noise immunity and can perform faster conversions with less sensitivity to series resistance than single-ended systems. The two diode system can be used with either fully differential or single-ended temperature measurement systems, which can be used when upgrading from a single-ended architecture to a fully differential architecture, and which can provide backwards compatibility to single-ended architectures for users of fully differential architectures. The simultaneous forwards and backwards compatibilities reduces development risk associated with switching from a proven architecture (e.g., single-ended) to a newer, less-proven, architecture (e.g., fully differential).
Show less

A method for removing component mismatch errors for a system parameter being set by a ratio of two or more physical, electrical components (“components”) of the same kind on an integrated circuit including providing an array of component units having the same component value, determining the actual component values of each component unit in the array, selecting component units based on the actual component values to form pairs of component units where the pairs have approximately the same total… Show more

A method for removing component mismatch errors for a system parameter being set by a ratio of two or more physical, electrical components (“components”) of the same kind on an integrated circuit including providing an array of component units having the same component value, determining the actual component values of each component unit in the array, selecting component units based on the actual component values to form pairs of component units where the pairs have approximately the same total component values, ordering the component unit pairs, assigning alternate component unit pairs to be associated with each of the two or more components, rotating at a first frequency the assignment of the component unit pairs. At each rotation, the component unit pairs to be associated with each component are shifted so that each component unit pair is associated with a different one of the two or more components in turn. Show less

A method for calibrating an analog-to-digital converter includes sampling an analog input signal and generating input samples, reversing the polarity of at least one input sample, averaging the digital output codes associated with a first pair of input samples where the first pair of input samples has opposite polarities, and generating an offset correction value being the average of the digital output codes associated with the first pair of input samples. In another embodiment, a method for… Show more

A method for calibrating an analog-to-digital converter includes sampling an analog input signal and generating input samples, reversing the polarity of at least one input sample, averaging the digital output codes associated with a first pair of input samples where the first pair of input samples has opposite polarities, and generating an offset correction value being the average of the digital output codes associated with the first pair of input samples. In another embodiment, a method for calibrating an ADC includes sampling the analog input signal and generating input samples, introducing an incremental value to modify the magnitude of at least one input sample, computing an actual gain value using the digital output codes associated with a first input sample and a second input sample having the modified magnitude, and generating a gain correction value being the ratio of an ideal gain of the ADC to the actual gain. Show less

An apparatus and method for canceling variations in the beta for a bipolar junction transistor so that the diode equation can be employed to accurately measure the temperature of the transistor based at least in part on a ratio of two target collector currents and two measurements of the base-emitter voltage of the transistor. If the determined collector current of the transistor is relatively equivalent to one of the first and second target collector currents, the transistor's base-emitter… Show more

An apparatus and method for canceling variations in the beta for a bipolar junction transistor so that the diode equation can be employed to accurately measure the temperature of the transistor based at least in part on a ratio of two target collector currents and two measurements of the base-emitter voltage of the transistor. If the determined collector current of the transistor is relatively equivalent to one of the first and second target collector currents, the transistor's base-emitter voltage is measured and stored. An analog feedback circuit can be employed to change the determined collector current to be relatively equivalent to the first and second target collector currents. The analog feedback circuit can include an optional sample and hold component to further reduce power consumption and reduce noise. A digital circuit can be employed to change the determined collector current to be relatively equivalent to the first and second target collector currents. Additionally, the transistor can be remotely located in another integrated circuit.
Show less